Editorial

Probabilistic design for reliability of aerospace electronics and photonics: role, significance, attributes, challenges

  • Received: 18 March 2024 Revised: 19 March 2024 Accepted: 19 March 2024 Published: 20 March 2024
  • Citation: Ephraim Suhir. Probabilistic design for reliability of aerospace electronics and photonics: role, significance, attributes, challenges[J]. Metascience in Aerospace, 2024, 1(2): 185-189. doi: 10.3934/mina.2024008

    Related Papers:



  • 加载中


    [1] Suhir E (1997) Applied Probability for Engineers and Scientists, McGraw Hill, New York. https://doi.org/10.1115/1.2792237
    [2] Suhir E (2010) Probabilistic Design for Reliability. Chip Scale Rev 14.
    [3] Suhir E (2017) Probabilistic Design for Reliability of Electronic Materials, Assemblies, Packages and Systems: Attributes, Challenges, Pitfalls, MMCTSE 2017, Cambridge, UK, Plenary Lecture.
    [4] Suhir E (2020) "Quantifying Unquantifiable" in Aerospace Electronics and Ergonomics Engineering: Review. J Aerosp Eng Mech (JAEM) 4: 306–347. https://doi.org/10.36959/422/449 doi: 10.36959/422/449
    [5] Suhir E (2022) Expected Lifetime of an Optical Silica Fiber Intended for Open Space Applications: Probabilistic Predictive Model. Acta Astronaut 192: 418–423. https://doi.org/10.1016/j.actaastro.2021.12.020 doi: 10.1016/j.actaastro.2021.12.020
    [6] Suhir E (2000) Microelectronics and Photonics—The Future. Microelectron J 31: 839–851. https://doi.org/10.1016/S0026-2692(00)00086-0 doi: 10.1016/S0026-2692(00)00086-0
    [7] Suhir E (2019) Human-in-the-Loop: Probabilistic Modeling of an Aerospace Mission Outcome, CRC Press. https://doi.org/10.1201/9781351132510
    [8] Suhir E, Kang S (2013) Boltzmann-Arrhenius-Zhurkov (BAZ) Model in Physics-of-Materials Problems. Mod Phys Lett B (MPLB) 27: 1330009. https://doi.org/10.1142/S0217984913300093 doi: 10.1142/S0217984913300093
    [9] Suhir E (2020) Boltzmann-Arrhenius-Zhurkov (BAZ) Equation and Its Applications, In Electronic-and-Photonic Aerospace Materials Reliability-Physics Problems. Int J Aeronaut Sci Aerosp Res 7: 210–223.
    [10] Suhir E (2014) Failure-Oriented-Accelerated-Testing (FOAT) and Its Role in Making a Viable IC Package into a Reliable Product. Circ Assembly. https://doi.org/10.1109/AERO.2014.6836189 doi: 10.1109/AERO.2014.6836189
    [11] Suhir E (2019) Failure-Oriented-Accelerated-Testing (FOAT), Boltzmann-Arrhenius-Zhurkov Equation (BAZ) and Their Application in Microelectronics and Photonics Reliability Engineering. Int J Aeronaut Sci Aerosp Res (IJASAR) 6: 185–191.
    [12] Suhir E (2024) A Tale of Three Types of Failure-Oriented-Accelerated-Tests and Their Roles in Assuring Aerospace Electronics and Photonics Reliability: Perspective. J Space Safe Eng, in print.
    [13] Silverman M (2012) 40 Years of HALT: What Have We Learned? OpsALaCarte LLC, IEEE EPS ASTR Seminar, Toronto, Canada.
    [14] Suhir E (2019) Burn-In Testing (BIT): To BIT or not to BIT, that's the Question. Aerospace 6: 29. https://doi.org/10.3390/aerospace6030029 doi: 10.3390/aerospace6030029
    [15] Suhir E (2023) Is Temperature Cycling an Adequate Accelerated Test in Reliability Physics of IC Products? Acta Sci Appl Phys (ASAP).
    [16] Suhir E, Yi S (2017) Probabilistic Design for Reliability (PDfR) of Medical Electronic Devices: When Reliability is Imperative, Ability to Quantify it is a Must. J SMT 30.
    [17] Suhir E (2020) Quantifying Unquantifiable: the Outcome of a Clinical Case Must Be Quantified to Make it Successful. Global J Med Clin Case Rep.
    [18] Tversky A, Kahneman D (1974) Judgment Under Uncertainty: Heuristics and Biases. Science 185: 1124–1131. https://doi.org/10.1126/science.185.4157.112 doi: 10.1126/science.185.4157.112
    [19] Kahneman D, Slovic P, Tversky A, et al. (1982) Judgment Under Uncertainty: Heuristics and Biases, Cambridge University Press. https://doi.org/10.1017/CBO9780511809477
    [20] Thurner S, Klimek P, Hanel R (2018) Introduction to the Theory of Complex Systems, Oxford Scholarship. https://doi.org/10.1093/oso/9780198821939.001.0001
    [21] Suhir E (2015) Analytical Modeling Enables Explaining Paradoxical Situations in the Behavior and Performance of Electronic Materials and Products: Review. J Phys Math 7: 1–2. https://doi.org/10.4172/2090-0902.1000161 doi: 10.4172/2090-0902.1000161
  • Reader Comments
  • © 2024 the Author(s), licensee AIMS Press. This is an open access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0)
通讯作者: 陈斌, bchen63@163.com
  • 1. 

    沈阳化工大学材料科学与工程学院 沈阳 110142

  1. 本站搜索
  2. 百度学术搜索
  3. 万方数据库搜索
  4. CNKI搜索

Metrics

Article views(454) PDF downloads(37) Cited by(0)

Article outline

Other Articles By Authors

/

DownLoad:  Full-Size Img  PowerPoint
Return
Return

Catalog