Topical Section: Materials Characterization
Materials characterization is an essential part in materials science, as it plays a vital role in understanding the structure-property relationship in materials. The advance in materials science has heavily depend on the development and utilization of advanced microstructural characterization techniques to understand materials microstructure. Researchers are invited to submit original research and comprehensive review articles for consideration for publication in the section “materials characterization” in the AIMS Materials Science. Topics include advanced microstructural characterization of a variety of materials via different techniques. Materials include but are not limited to metals, alloys, ceramics, polymers and composites. Techniques include but are not limited to scanning electron microscopy, transmission electron microscopy, scanning transmission electron microscopy, high resolution (scanning) transmission electron microscopy, electron backscatter diffraction, energy dispersive x-ray spectroscopy, electron energy loss spectroscopy, precession electron diffraction, energy-filtered transmission electron microscopy, and atom probe tomography. Submissions are particularly welcome on utilizing advanced microstructural characterization techniques to study advanced materials such as nanostructured materials.
Handling Editor(s)
Haiming Wen | Missouri University of Science and Technology, Rolla, Missouri, USA |
Daolun Chen | Department of Mechanical and Industrial Engineering, Ryerson University 350 Victoria Street, Toronto, Ontario M5B 2K3, Canada |
Jianxi Zhu | Key Laboratory of Mineralogy and Metallogeny, Guangzhou Institute of Geochemistry, Chinese Academy of Sciences, 511 Kehua St. Wushan, Guangzhou, 510640, China |
Enzo Martinelli | Associate Professor Department of Civil Engineering, University of Salerno, Via Giovanni Pallo II, 132 84084 Fisciano (SA), Italy |
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