Manuscript Topics

X-ray microscopies have matured into indispensable characterization tools for materials sciences providing nearly nanoscale spatial resolution including tomographic capabilities with elemental, chemical and magnetic sensitivity, and temporal resolution down to the fsec regime. To document the state-of-the-art and current research directions, we invite leading researchers in this field to submit original research and comprehensive review articles for consideration for publication in a special issue on “X-ray microscopy in Materials Sciences”. These articles will be published in AIMS Materials Science open access free of charge. Submitted papers should not have been previously published nor be currently under consideration for publication elsewhere. All manuscripts will be peer-reviewed before their acceptance for publication.

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